XPAD X-ray hybrid pixel detector for charge density quality diffracted intensities on laboratory equipment

Wenger, E.; Dahaoui, S.; Alle, P.; Parois, P.; Palin, C.; Lecomte, C.; Schaniel, D.

doi:10.1107/S2052520614017338

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 1
The prototype diffractometer. On the left side, the Incoatec Mo X-ray microsource. In the centre, the Mach3 goniometer and on the right side, the XPAD detector.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 70| Part 5| September 2014| Pages 783-791

doi:10.1107/S2052520614017338

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