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Figure 4
Fit of the calculated to the experimental PXRD pattern after Rietveld refinement (x-axis: °2θ; y-axis: counts). Calculated (blue), observed (red) and difference (black) profiles are shown. Tick marks are shown at the bottom of the profile.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 71| Part 1| February 2015| Pages 89-94
doi:10.1107/S2052520615000724
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