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Figure 1
hk0 and hk1 plane diffraction patterns of Cs2GeB4O9 (a)–(b) and Cs2SiB4O9 (c)–(d).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 72| Part 2| April 2016| Pages 194-200
doi:10.1107/S2052520615019733
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