view article

Figure 33
Wilson plot for observed and calculated data from FSTW-YIFZAP. Note that the calculated data (blue) show a steady trend from right to left, while there is a sudden up-turn in the observed data (green) at about ρ = 0.3. This up-turn is often characteristic of an attempt to measure data to too high a resolution for the given crystal size, X-ray source and exposure time. The high-angle data is essentially just noise (Weiss, 2001BB49).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Follow Acta Cryst. B
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds