Epitaxial growth and structure of cobalt ferrite thin films with large inversion parameter on Ag(001)

De Santis, M.; Bailly, A.; Coates, I.; Grenier, S.; Heckmann, O.; Hricovini, K.; Joly, Y.; Langlais, V.; Ramos, A.Y.; Richter, C.; Torrelles, X.; Garaudée, S.; Geaymond, O.; Ulrich, O.

doi:10.1107/S2052520618016177

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 4
Experimental CoFe₂O₄ film structure factors measured along nine inequivalent rods with relative error bars (black symbols) and best fits (continuous red lines). The corresponding (HK) values are indicated on each panel. L is related to the c_film unit-cell constant.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 75| Part 1| February 2019| Pages 8-17

https://doi.org/10.1107/S2052520618016177

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