 | Acta Crystallographica Section B Acta Crystallographica Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS |
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![[Figure 2]](xk5049fig2mag.jpg)
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Figure 2
HRXRD measurements in symmetric 2θ/ω geometry of Gd2O3 layers grown at 250°C. (a) Without additional oxygen supply (5 × 10−8 mbar) and with additional oxygen partial pressure (2 × 10−7 mbar). In (b) a detailed symmetric 2θ/ω measurement with improved signal to noise ratio of the reflection at 2θ ≃ 30° from the symmetric 2θ/ω measurement in (a) is shown. The side intensity on the left side of the Si(002) reflection in (b) could be attributed to Umweganregung (Zaumseil, 2015  ). |
![[Figure 2]](xk5049fig2.jpg)
| STRUCTURAL SCIENCE CRYSTAL ENGINEERING MATERIALS |
ISSN: 2052-5206
