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Figure 6
φ scans in GIXRD configuration around (a) the 020 and (b) the 111 reflections of the Gd2O3 layer.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 75| Part 1| February 2019| Pages 59-70
https://doi.org/10.1107/S2052520618017869
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