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Figure 8
(a) Symmetric 2θ/ω measurements of Gd2O3 layers grown at 250°C with and without a temperature ramp up during the growth. (b) Fit of the [40{\bar 2}] reflection of both measurements.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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