Methods for orientation and phase identification of nano-sized embedded secondary phase particles by 4D scanning precession electron diffraction

Rauch, E.F.; Véron, M.

doi:10.1107/S2052520619007583

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 12
Superimposed diffracting signals from the matrix and a precipitate (a) and the corresponding indexing as (b) Al₁₂Mn (blue template) or (c) Al₅₀Mn₁₂Si (green template). The latter is obtained by subtracting the local average that contains the strong reflections related to the matrix diffraction.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 75| Part 4| August 2019| Pages 505-511

https://doi.org/10.1107/S2052520619007583

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