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Figure 1
EDT summarized workflow. The diagram on the left-hand side sketches how a stack of diffraction patterns is acquired through a sequential tilt of the nanocrystal under study. The four images from the right-hand side correspond to projections of the reconstructed diffraction space of π-ferrosilicide after data processing (Bowden et al., 2018BB11).

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 75| Part 4| August 2019| Pages 463-474
https://doi.org/10.1107/S2052520619006711
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