Automated electron diffraction tomography – development and applications

Kolb, U.; Krysiak, Y.; Plana-Ruiz, S.

doi:10.1107/S2052520619006711

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 2
HAADF-STEM image (a) showing a single 30 nm × 40 nm WO₃ particle and diffraction patterns (b) and (c) corresponding to beam probes of 20 nm [area circled in red in (a)] and 200 nm [area circled in blue in (a)], respectively. Histograms in (d) and (e) correspond to the green arrows on (b) and (c), respectively. Exposure time was set to 0.1 s for (b) and 10 s for (c) in order to have the same electron dose on the illuminated area.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 75| Part 4| August 2019| Pages 463-474

https://doi.org/10.1107/S2052520619006711

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