Automated electron diffraction tomography – development and applications

Kolb, U.; Krysiak, Y.; Plana-Ruiz, S.

doi:10.1107/S2052520619006711

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
(a) Sketch of the reference system used to identify the tilt axis of an ADT measurement. (b), (c) and (d) correspond to three different stereographic projections of different tilt axis positions. (d) corresponds to the exact position of the tilt axis, which gives a sharp contrasted image.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 75| Part 4| August 2019| Pages 463-474

https://doi.org/10.1107/S2052520619006711

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