TAAM: a reliable and user friendly tool for hydrogen-atom location using routine X-ray diffraction data

Jha, K.K.; Gruza, B.; Kumar, P.; Chodkiewicz, M.L.; Dominiak, P.M.

doi:10.1107/S2052520620002917

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 2
Comparison of reliability factor (R_f) for the TAAM and IAM refinements at 0.8 Å resolution. Hydrogen atoms were refined with isotropic displacement parameters.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 76| Part 3| June 2020| Pages 296-306

https://doi.org/10.1107/S2052520620002917

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