|
Figure 12
Electrical resistance measurements on Si for calibrating and testing the experimental set-up as function of pressure using the four-point probe method up to 21 (1) GPa in comparison to data of Garg et al. (2004 ![]() |
Open
access

|
Figure 12
Electrical resistance measurements on Si for calibrating and testing the experimental set-up as function of pressure using the four-point probe method up to 21 (1) GPa in comparison to data of Garg et al. (2004 ![]() |