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Figure 1
Rietveld plots of NaOEt performed in different space groups under identical conditions, i.e. (a) P4/nmm and (b) P[\overline 4]21m. Experimental data are shown as black dots and simulated data as a red line, with the difference curve in green below. The vertical tick marks denote the reflection positions. The small arrow in (b) denotes the 210 reflection, which is extinct in P4/nmm, but present in P[\overline 4]21m.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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