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Figure 6
Final Rietveld plots of (a) NaOnPr, (b) NaOnBu and (c) NaOnAm. Experimental data are shown as black dots and simulated data as a red line, with the difference curve in green below. The vertical tick marks denote the reflection positions.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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