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Figure 1
For synthetic γ-alumina nanoparticles: (a) TEM image, (b) electron diffraction image, (c) intensity profile of (b) and Rietveld refinement using Smrčok model, (d) Rietveld refined profile using Smrčok model after background removal and (e) Rietveld refined profile using Paglia model after background removal; (f) Rietveld refined profile using this-work model after background removal.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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