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Figure 4
(a) The final electron diffraction pattern of γ phase after e-beam irradiation [same as Fig. 3[link](g)]. (b) Rietveld refinement using Smrčok model; (c) Rietveld refinement using Paglia model; (d) Rietveld refinement using this-work model and (e) comparison of synthetic and irradiated γ phase after background removal using the model in this work.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 77| Part 5| October 2021| Pages 772-784
https://doi.org/10.1107/S2052520621008027
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