Powder X-ray diffraction as a powerful tool to exploit in organic electronics: shedding light on the first N,N′,N′′-tri­alkyl­diindolocarbazole

Vilche, A.; Bujaldón, R.; Alcobé, X.; Velasco, D.; Puigjaner, C.

doi:10.1107/S2052520622001858

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Starting model of 1 used in the Simulated Annealing solution process in TOPAS. The torsion angles refined are indicated by arrows and three of them are specified in one of the alkyl chains.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 78| Part 2| April 2022| Pages 253-260

https://doi.org/10.1107/S2052520622001858

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