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Figure 3
(a) The position-sensitive detector (PSD) system used to record X-ray data from about 1990. (b) An example diffraction pattern recorded on the PSD system. The 0kl section of Bemb2 (1,3-dibromo-2,5-diethyl-4,6-dimethylbenzene) recorded at 100 K.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 78| Part 3| June 2022| Pages 344-355
https://doi.org/10.1107/S2052520621012865
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