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Figure 6
(a) Histograms of the local defect concentration for various correlation models, with the correlations quantified by α in equation (2)[link]. The labels −0.1 1NN and −0.1 4NN correspond to models with correlations of −0.1 spanning one and four nearest neighbors, respectively. (b) From top to bottom, the experimental scattering from ID28 and the calculated diffuse scattering patterns for positive and negative correlations along the 4k1 direction.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 78| Part 6| December 2022| Pages 842-847
https://doi.org/10.1107/S2052520622010083
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