 | Acta Crystallographica Section B Acta Crystallographica Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS |
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![[Figure 4]](aw5077fig4mag.jpg)
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Figure 4
Thermal data of NDMF capturing the desolvation to α-NIF. (a) Surface plot of VT-XRPD data from 318 K to 408 K. (b) Unit-cell parameters from Rietveld refinements of each XRPD pattern. Closed symbols represent data for the solvate; open symbols represent data for desolvated structure. The data were fitted with the Berman equation of state (Angel et al., 2014  ; Gonzalez-Platas et al., 2016; Berman, 1988). (c) DSC and TGA traces for NDMF. (d) XRPD pattern for the DMF solvate collected at 293 K [the model (blue) is superimposable on the data (red) indicating a good fit]. (e) XRPD pattern obtained at 358 K (after phase change). The pattern is well accounted for by indexed phase (β-NDMF) and minor component of NIF A. For both fitted patterns [(d) and (e)], the experimental data are shown in blue, whilst the calculated profile is shown in red. The difference profile is displayed underneath the diffraction pattern. |
![[Figure 4]](aw5077fig4.jpg)
| STRUCTURAL SCIENCE CRYSTAL ENGINEERING MATERIALS |
ISSN: 2052-5206
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