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Figure 1
Simultaneously acquired: (a) BSE SEM image of the recovered sample #HH266, and EDX mapping of (b) Ge-L edge and (c) Sn-L edge. White scale bar = 2.5 µm. Red arrows indicate Ge-enriched grains. The white rectangle indicates the position of FIB sampling.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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