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Figure 2
(a, b) The FIB processed sample of β-Li2IrO3 under an optical microscope for two different magnifications. The red rectangle in (b) marks the measurement area while (c) shows the FIB processed sample on a gold covered STO substrate used for the X-ray diffraction measurements. (d) A separate β-Li2IrO3 bulk crystal was also prepared as a reference, and characterized with X-ray diffraction.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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