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Figure 4
Fluorescence and absorption effects of the diffraction pattern from an XI crystal in 2 M (NH4)2SeO4 recorded at four different wavelengths about the Se K-edge and of the same region of reciprocal space. (a) Low-energy remote, 12 500 eV; (b) inflection point, 12 657.5 eV; (c) peak fluorescence, 12 660 eV; (d) high-energy remote, 12 663 eV.

Journal logoBIOLOGICAL
CRYSTALLOGRAPHY
ISSN: 1399-0047
Volume 56| Part 10| October 2000| Pages 1288-1303
doi:10.1107/S0907444900009574
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