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Figure 3
A schematic block diagram to show how a beamline fault might be localized (and hence diagnosed and corrected). The surveillance system receives information on the status of the beamline (lower part of the drawing). The intelligent beamline device compares the expected beamline performance for each sub-assembly (either by prior knowledge of expected performance or by modelling) in order to verify the state (denoted here schematically by a `figure-of-merit value') of each sub-assembly. This process can be extended to identify individual faulty components.

Journal logoBIOLOGICAL
CRYSTALLOGRAPHY
ISSN: 1399-0047
Volume 62| Part 1| December 2006| Pages 12-18
doi:10.1107/S0907444905039570
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