Figure 1
Example section of a diffraction image with spots extending to 2.1 Å resolution into the corners of the detector. The inset at the top right is an on-beam-axis view of two example crystals located at the edge of a crystallization drop captured during data collection. The red circle represents the full-width half-maximum of the beam profile and has been matched to the crystal size. The matching of the beam size to that of the crystal optimized the signal-to-noise ratio of the data. |