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Figure 2
Peak fitting for a representative reflection. (a) The intensity profiles of slices are visualized along the indicated direction and centered on the (−2, 3, −8) reflection of a simulated crystal tomogram. In (b), the intensities are shown in 2D, with high-intensity pixels assigned to the peak marked by an X. In (c), the phases in the vicinity of the peak are visualized using the same color scheme as in Fig. 1 . The phase values of pixels retained as part of the peak are noted in degrees. The high-intensity pixel marked by a yellow X in (b) had a phase value of 17° and was discarded as an outlier. |


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