Figure 2
Peak fitting for a representative reflection. (a) The intensity profiles of slices are visualized along the indicated direction and centered on the (−2, 3, −8) reflection of a simulated crystal tomogram. In (b), the intensities are shown in 2D, with high-intensity pixels assigned to the peak marked by an X. In (c), the phases in the vicinity of the peak are visualized using the same color scheme as in Fig. 1. The phase values of pixels retained as part of the peak are noted in degrees. The high-intensity pixel marked by a yellow X in (b) had a phase value of 17° and was discarded as an outlier. |