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Figure 3
A multi-position data-acquisition strategy reduces the cumulative incident beam fluence during 3D-ED/MicroED data collection. (a) A crystal used for 3D-ED/MicroED data collection at a single position while tilting the sample stage through a total range of 90°. (b) The resulting diffraction patterns at the indicated tilt angles with the corresponding cumulative incident beam fluence. (c) Multi-position 3D-ED/MicroED data collection involves the acquisition of diffraction data from multiple positions along a single crystal within an accumulated total tilt range of 90°. (d) The resulting diffraction patterns taken at the indicated tilt angles using a cumulative fluence of ≤4 e− Å−2 throughout the acquisition range. For each diffraction image, the highest resolution Bragg reflection is highlighted with a red circle (magnified view on the lower right). Data recorded using the multi-position strategy show significantly improved diffraction, with distinct reflections up to around 3.2 Å resolution. |

journal menu![[Figure 3]](he5693fig3.jpg)
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