1-[(Z)-2-Butyltellanyl-1-chloroethenyl]cyclohex-1-ene

The TeII atom in the title molecule, C12H19ClTe, is coordinated in a V-shaped geometry by C atoms derived from the disparate organic substituents. A short intramolecular C—H⋯Cl contact occurs owing to the proximity of the ethene bond in the six-membered ring to the Cl atom. In the crystal, molecules assemble into layers parallel to the ac plane, with the closest interactions between them being of the Te⋯Te type [3.9993 (16) Å].

The Te II atom in the title molecule, C 12 H 19 ClTe, is coordinated in a V-shaped geometry by C atoms derived from the disparate organic substituents. A short intramolecular C-HÁ Á ÁCl contact occurs owing to the proximity of the ethene bond in the six-membered ring to the Cl atom. In the crystal, molecules assemble into layers parallel to the ac plane, with the closest interactions between them being of the TeÁ Á ÁTe type [3.9993 (16) Å ].
In the crystal packing, molecules assemble into layers parallel to the ac plane, Fig. 2. Within layers, Te···Te i contacts of 3.9993 (16) Å, i.e. less than the sum of the van der Waals radius for Te of 4.4 Å (Bondi, 1964), are noted; i: -x, -y, 2 -z.

Experimental
The title compound was prepared as described in a previous study (Guadagnin et al., 2008). Crystals of (I) were obtained by slow evaporation from its CHCl 3 solution held at room temperature.

Refinement
C-bound H-atoms were placed in calculated positions (C-H = 0.95-0.99 Å) and were included in the refinement in the riding model approximation with U iso (H) = 1.2-1.5U eq (C). Owing to poor agreement, three reflections, i.e. (2 8 3), (1 4 4) and (1 5 6), were omitted from the final refinement.  (Altomare et al., 1999); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: ORTEP-3 (Farrugia, 1997) and DIAMOND (Brandenburg, 2006); software used to prepare material for publication: MarvinSketch (ChemAxon, 2010) and publCIF (Westrip, 2010).    A view in projection down the a axis of the unit-cell contents for (I). Special details Geometry. All s.u.'s (except the s.u. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell s.u.'s are taken into account individually in the estimation of s.u.'s in distances, angles and torsion angles; correlations between s.u.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell s.u.'s is used for estimating s.u.'s involving l.s. planes. Refinement. Refinement of F 2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F 2 , conventional R-factors R are based on F, with F set to zero for negative F 2 . The threshold expression of F 2 > 2σ(F 2 ) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F 2 are statistically about twice as large as those based on F, and R-factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å 2 )
x y z U iso */U eq