Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768103026284/bk5003sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768103026284/bk5003sup2.fcf |
CCDC reference: 230853
Data collection: Collect (Nonius, 2001); cell refinement: DENZO SMN (Otwinowski & Minor 1997); data reduction: DENZO SMN (Otwinowski & Minor 1997); program(s) used to solve structure: SHELXS97 (Sheldrick, 1990); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: ORTEP-3 for Windows (Farrugia, 1997).
C6H9N3O3 | Dx = 1.412 Mg m−3 |
Mr = 171.16 | Mo Kα radiation, λ = 0.71073 Å |
Trigonal, R3c | Cell parameters from 488 reflections |
Hall symbol: R 3 -2"c | θ = 1.8–25.1° |
a = 14.027 (1) Å | µ = 0.12 mm−1 |
c = 7.088 (1) Å | T = 293 K |
V = 1207.8 (2) Å3 | Hexagonal rods, colorless |
Z = 6 | 0.31 × 0.24 × 0.15 mm |
F(000) = 540 |
Nonius KappaCCD diffractometer | 204 reflections with I > 2σ(I) |
Radiation source: fine-focus sealed tube | Rint = 0.012 |
Graphite monochromator | θmax = 25.1°, θmin = 5.3° |
Detector resolution: 95 pixels mm-1 | h = 0→16 |
ω–scans | k = −13→0 |
439 measured reflections | l = −8→8 |
238 independent reflections |
Refinement on F2 | Secondary atom site location: difference Fourier map |
Least-squares matrix: full | Hydrogen site location: inferred from neighbouring sites |
R[F2 > 2σ(F2)] = 0.032 | H atoms treated by a mixture of independent and constrained refinement |
wR(F2) = 0.082 | w = 1/[σ2(Fo2) + (0.0441P)2 + 0.2582P] where P = (Fo2 + 2Fc2)/3 |
S = 1.12 | (Δ/σ)max < 0.001 |
238 reflections | Δρmax = 0.09 e Å−3 |
40 parameters | Δρmin = −0.09 e Å−3 |
1 restraint | Absolute structure: Flack H D (1983), Acta Cryst. A39, 876-881 |
Primary atom site location: structure-invariant direct methods | Absolute structure parameter: 0 (10) |
C6H9N3O3 | Z = 6 |
Mr = 171.16 | Mo Kα radiation |
Trigonal, R3c | µ = 0.12 mm−1 |
a = 14.027 (1) Å | T = 293 K |
c = 7.088 (1) Å | 0.31 × 0.24 × 0.15 mm |
V = 1207.8 (2) Å3 |
Nonius KappaCCD diffractometer | 204 reflections with I > 2σ(I) |
439 measured reflections | Rint = 0.012 |
238 independent reflections |
R[F2 > 2σ(F2)] = 0.032 | H atoms treated by a mixture of independent and constrained refinement |
wR(F2) = 0.082 | Δρmax = 0.09 e Å−3 |
S = 1.12 | Δρmin = −0.09 e Å−3 |
238 reflections | Absolute structure: Flack H D (1983), Acta Cryst. A39, 876-881 |
40 parameters | Absolute structure parameter: 0 (10) |
1 restraint |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
N1 | 0.0372 (2) | −0.07375 (19) | 0.4141 (3) | 0.0596 (8) | |
C2 | 0.1031 (2) | 0.0353 (2) | 0.4148 (3) | 0.0574 (10) | |
O3 | 0.20930 (18) | 0.06550 (15) | 0.4181 (5) | 0.0833 (9) | |
C4 | 0.2881 (3) | 0.1831 (3) | 0.4224 (7) | 0.0990 (16) | |
H4A | 0.3616 | 0.1946 | 0.4245 | 0.114 (16)* | |
H4B | 0.2761 | 0.2150 | 0.5333 | 0.118 (16)* | |
H4C | 0.2788 | 0.2174 | 0.3121 | 0.125 (17)* |
U11 | U22 | U33 | U12 | U13 | U23 | |
N1 | 0.043 (2) | 0.0442 (14) | 0.0917 (19) | 0.0222 (16) | 0.0030 (11) | 0.0013 (11) |
C2 | 0.0416 (16) | 0.050 (2) | 0.080 (2) | 0.0225 (14) | 0.0004 (13) | 0.0034 (13) |
O3 | 0.0398 (12) | 0.0504 (13) | 0.156 (2) | 0.0197 (10) | 0.0047 (12) | 0.0067 (13) |
C4 | 0.045 (2) | 0.056 (2) | 0.182 (5) | 0.0152 (16) | 0.005 (2) | 0.007 (3) |
N1—C2i | 1.315 (4) | O3—C4 | 1.457 (4) |
N1—C2 | 1.335 (4) | C4—H4A | 0.9600 |
C2—N1ii | 1.315 (4) | C4—H4B | 0.9600 |
C2—O3 | 1.330 (3) | C4—H4C | 0.9600 |
C2i—N1—C2 | 112.6 (3) | O3—C4—H4B | 109.5 |
N1ii—C2—O3 | 119.7 (2) | H4A—C4—H4B | 109.5 |
N1ii—C2—N1 | 127.4 (3) | O3—C4—H4C | 109.5 |
O3—C2—N1 | 112.9 (2) | H4A—C4—H4C | 109.5 |
C2—O3—C4 | 117.1 (3) | H4B—C4—H4C | 109.5 |
O3—C4—H4A | 109.5 | ||
C2i—N1—C2—N1ii | −0.8 (5) | N1ii—C2—O3—C4 | 0.5 (4) |
C2i—N1—C2—O3 | 178.7 (2) | N1—C2—O3—C4 | −179.0 (3) |
Symmetry codes: (i) −x+y, −x, z; (ii) −y, x−y, z. |
Experimental details
Crystal data | |
Chemical formula | C6H9N3O3 |
Mr | 171.16 |
Crystal system, space group | Trigonal, R3c |
Temperature (K) | 293 |
a, c (Å) | 14.027 (1), 7.088 (1) |
V (Å3) | 1207.8 (2) |
Z | 6 |
Radiation type | Mo Kα |
µ (mm−1) | 0.12 |
Crystal size (mm) | 0.31 × 0.24 × 0.15 |
Data collection | |
Diffractometer | Nonius KappaCCD diffractometer |
Absorption correction | – |
No. of measured, independent and observed [I > 2σ(I)] reflections | 439, 238, 204 |
Rint | 0.012 |
(sin θ/λ)max (Å−1) | 0.596 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.032, 0.082, 1.12 |
No. of reflections | 238 |
No. of parameters | 40 |
No. of restraints | 1 |
H-atom treatment | H atoms treated by a mixture of independent and constrained refinement |
Δρmax, Δρmin (e Å−3) | 0.09, −0.09 |
Absolute structure | Flack H D (1983), Acta Cryst. A39, 876-881 |
Absolute structure parameter | 0 (10) |
Computer programs: Collect (Nonius, 2001), DENZO SMN (Otwinowski & Minor 1997), SHELXS97 (Sheldrick, 1990), SHELXL97 (Sheldrick, 1997), ORTEP-3 for Windows (Farrugia, 1997).