research papers
Hydrothermally grown crystals of β-K3NdSi6O15, potassium neodymium silicate, have been studied by single-crystal X-ray methods. Under appropriate conditions, the compound crystallizes in space group Bb21m and has lattice constants a = 14.370 (2), b = 15.518 (2) and c = 14.265 (2) Å. There are 30 atom sites in the asymmetric unit of the basic structure. With eight formula units per unit cell, the calculated density is 2.798 Mg m−3. Refinement was carried out to a residual, wR(F2), of 0.1177 [R(F) = 0.0416] using anisotropic temperature factors for all atoms. The structure is based on (Si2O52−)∞ layers, connected by Nd polyhedra to form a three-dimensional framework. Potassium ion sites, some of which are only partially occupied, are located within channels that run between the silicate layers. The silica–neodymia framework of β-K3NdSi6O15, in particular the linkages formed between the silicate layers and Nd polyhedra, bears some similarities to that of the essentially isocompositional phase α-K3NdSi6O15·2H2O. In both, the silicate layers are corrugated so as to accommodate a simple cubic array of NdO6 octahedra with lattice constant ∼ 7.5 Å. Furthermore, the Si2O5 layers in β-K3NdSi6O15 are topologically identical to those of the mineral sazhinite, Na2HCeSi6O15. Although β-K3NdSi6O15 and sazhinite are not isostructural, the structures of each can be described as slight distortions of a high-symmetry parent structure with space group Pbmm.
Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768199015797/bs0008sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768199015797/bs0008sup2.hkl |
(1) top
Crystal data top
K3NdSi6O15 | Z = 8 |
Mr = 670.0 | F(000) = 2520 |
Orthorhombic, Bb21m | Dx = 2.798 Mg m−3 |
Hall symbol: B -2 -2b | Mo Kα radiation, λ = 0.71073 Å |
a = 14.370 (2) Å | Cell parameters from 22 reflections |
b = 15.518 (2) Å | µ = 4.31 mm−1 |
c = 14.265 (2) Å | T = 293 K |
V = 3181.0 (7) Å3 | 0.3 × 0.3 × 0.2 mm |
Data collection top
Siemens R3m-V diffractometer | θmax = 27.5°, θmin = 2.0° |
Absorption correction: ψ scan (empirical (using intensity measurements) ? | h = 0→18 |
Tmin = 0.057, Tmax = 0.119 | k = 0→20 |
1975 measured reflections | l = 0→18 |
1975 independent reflections | 69 standard reflections |
1974 reflections with I > 2σ | intensity decay: min 0.9887, max 1.0353, final 1.0160, mean 1.0137% |
Rint = 0 |
Refinement top
Refinement on F2 | 1 restraint |
Least-squares matrix: Full-matrix least-squares | w = 1/[σ2Fo2 + (0.0746P)2 + 44.0045P]
where P = [max(Fo2,0) + 2Fc2]/3 |
R[F2 > 2σ(F2)] = 0.042 | (Δ/σ)max = 0.177 |
wR(F2) = 0.117 | Δρmax = 2.59 e Å−3 |
S = 1.13 | Δρmin = −1.76 e Å−3 |
1974 reflections | Absolute structure: Flack, 1983) |
244 parameters | Absolute structure parameter: 0.10 (3) |
Crystal data top
K3NdSi6O15 | V = 3181.0 (7) Å3 |
Mr = 670.0 | Z = 8 |
Orthorhombic, Bb21m | Mo Kα radiation |
a = 14.370 (2) Å | µ = 4.31 mm−1 |
b = 15.518 (2) Å | T = 293 K |
c = 14.265 (2) Å | 0.3 × 0.3 × 0.2 mm |
Data collection top
Siemens R3m-V diffractometer | 1974 reflections with I > 2σ |
Absorption correction: ψ scan (empirical (using intensity measurements) ? | Rint = 0 |
Tmin = 0.057, Tmax = 0.119 | 69 standard reflections |
1975 measured reflections | intensity decay: min 0.9887, max 1.0353, final 1.0160, mean 1.0137% |
1975 independent reflections |
Refinement top
R[F2 > 2σ(F2)] = 0.042 | (Δ/σ)max = 0.177 |
wR(F2) = 0.117 | Δρmax = 2.59 e Å−3 |
S = 1.13 | Δρmin = −1.76 e Å−3 |
1974 reflections | Absolute structure: Flack, 1983) |
244 parameters | Absolute structure parameter: 0.10 (3) |
1 restraint |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
x | y | z | Biso*/Beq | ||
Nd(1) | 0.49154 (3) | 0.57468 (6) | 0.76341 (3) | ||
Si(1) | 0.3846 (2) | 0.7537 (2) | 0.6119 (2) | ||
Si(2) | 0.6157 (2) | 0.4554 (2) | 0.6051 (2) | ||
Si(3) | 0.3352 (2) | 0.7146 (2) | 0.8969 (2) | ||
Si(4) | 0.7796 (2) | 0.4854 (2) | 0.7495 (2) | ||
Si(5) | 0.6511 (2) | 0.4129 (2) | 0.8930 (2) | ||
Si(6) | 0.7284 (2) | 0.6711 (2) | 0.7837 (2) | ||
K(1) | 0.4616 (2) | 0.3182 (2) | 0.7854 (3) | ||
K(2) | 0.5754 (3) | 0.6302 (4) | 0 | ||
K(3) | 0.8658 (4) | 0.4920 (3) | 0.5000 | ||
K(4) | 0.8725 (3) | 0.5194 (4) | 0 | ||
K(5) | 0.5896 (3) | 0.6691 (3) | 0.5000 | ||
K(6) | 0.8463 (10) | 0.3053 (11) | 0.5000 | ||
O(1) | 0.7874 (5) | 0.5821 (6) | 0.7990 (5) | ||
O(2) | 0.4057 (6) | 0.8563 (5) | 0.6299 (6) | ||
O(3) | 0.3788 (6) | 0.8116 (5) | 0.8869 (5) | ||
O(4) | 0.6974 (7) | 0.4919 (7) | 0.6720 (6) | ||
O(5) | 0.6849 (8) | 0.4354 (8) | 0 | ||
O(6) | 0.8790 (6) | 0.4633 (5) | 0.7096 (7) | ||
O(7) | 0.7856 (8) | 0.7081 (7) | 0.5000 | ||
O(8) | 0.9570 (6) | 0.6962 (5) | 0.8319 (6) | ||
O(9) | 0.1215 (5) | 0.6630 (6) | 0.6951 (6) | ||
O(10) | 0.8906 (9) | 0.7351 (9) | 0 | ||
O(11) | 0.7482 (6) | 0.4201 (6) | 0.8321 (6) | ||
O(12) | 0.4142 (5) | 0.6453 (5) | 0.1137 (6) | ||
O(13) | 0.6607 (8) | 0.4602 (9) | 0.5000 | ||
O(14) | 0.5710 (6) | 0.4750 (5) | 0.8597 (7) | ||
O(15) | 0.2239 (6) | 0.2381 (6) | 0.8582 (6) | ||
O(16) | 0.2509 (6) | 0.2046 (6) | 0.6766 (6) | ||
O(17) | 0.5265 (7) | 0.5127 (6) | 0.6165 (6) |
Experimental details
Crystal data | |
Chemical formula | K3NdSi6O15 |
Mr | 670.0 |
Crystal system, space group | Orthorhombic, Bb21m |
Temperature (K) | 293 |
a, b, c (Å) | 14.370 (2), 15.518 (2), 14.265 (2) |
V (Å3) | 3181.0 (7) |
Z | 8 |
Radiation type | Mo Kα |
µ (mm−1) | 4.31 |
Crystal size (mm) | 0.3 × 0.3 × 0.2 |
Data collection | |
Diffractometer | Siemens R3m-V diffractometer |
Absorption correction | ψ scan (empirical (using intensity measurements) |
Tmin, Tmax | 0.057, 0.119 |
No. of measured, independent and observed (I > 2σ) reflections | 1975, 1975, 1974 |
Rint | 0 |
(sin θ/λ)max (Å−1) | 0.650 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.042, 0.117, 1.13 |
No. of reflections | 1974 |
No. of parameters | 244 |
No. of restraints | 1 |
w = 1/[σ2Fo2 + (0.0746P)2 + 44.0045P]
where P = [max(Fo2,0) + 2Fc2]/3 | |
(Δ/σ)max | 0.177 |
Δρmax, Δρmin (e Å−3) | 2.59, −1.76 |
Absolute structure | Flack, 1983) |
Absolute structure parameter | 0.10 (3) |
Computer programs: SHELXL (Sheldrick, 1993).