Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536805039267/bt6793sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S1600536805039267/bt6793Isup2.hkl |
CCDC reference: 296523
The title compound was purchased as a white powder from Merck. 0.532 g were dissolved in 5 ml of methanol and the solution left (2.22 mmol) to stand to afford white crystals of (I) within 5 days. Elemental analysis for C14H9NOS found: C 70.2, H 2.8, N 5.9%; calculated: C 70.3, H 3.8, N 5.9%; FAB–MS (Fisons VG Autospec) m/z 238.3 (100%).
The H atoms were refined using a riding model, with C—H = 0.93 Å and Uiso(H) = 1.2Uiso(C). The highest peak in the final difference synthesis is 0.87 Å from atom S1 and the deepest hole is 0.80 Å from this atom.
Data collection: R3m/V User's Guide (Siemens, 1989); cell refinement: R3m/V User's Guide; data reduction: XDISK (Siemens, 1989); program(s) used to solve structure: SHELXS97 (Sheldrick, 1997); program(s) used to refine structure: SHELXL97 (Sheldrick, 1997); molecular graphics: SHELXTL-Plus (Sheldrick, 1995); software used to prepare material for publication: SHELXL97.
C14H9NOS | F(000) = 248 |
Mr = 239.28 | Dx = 1.334 Mg m−3 |
Monoclinic, P21 | Mo Kα radiation, λ = 0.71073 Å |
Hall symbol: P 2yb | Cell parameters from 15 reflections |
a = 7.499 (5) Å | θ = 7.6–15.8° |
b = 7.835 (3) Å | µ = 0.25 mm−1 |
c = 10.624 (7) Å | T = 294 K |
β = 107.37 (8)° | Needle, colourless |
V = 595.8 (6) Å3 | 0.59 × 0.26 × 0.21 mm |
Z = 2 |
Siemens P4 four-circle diffractometer | 1816 reflections with I > 2σ(I) |
Radiation source: fine-focus sealed tube | Rint = 0.013 |
Graphite monochromator | θmax = 25.1°, θmin = 2.0° |
ω scans | h = −1→8 |
Absorption correction: psi-scan (XPREP in SHELXTL-Plus; Sheldrick, 1995) | k = −9→9 |
Tmin = 0.928, Tmax = 0.947 | l = −12→12 |
2572 measured reflections | 3 standard reflections every 100 reflections |
2068 independent reflections | intensity decay: none |
Refinement on F2 | Hydrogen site location: inferred from neighbouring sites |
Least-squares matrix: full | H-atom parameters constrained |
R[F2 > 2σ(F2)] = 0.033 | w = 1/[σ2(Fo2) + (0.0284P)2 + 0.1314P] where P = (Fo2 + 2Fc2)/3 |
wR(F2) = 0.077 | (Δ/σ)max = 0.001 |
S = 1.02 | Δρmax = 0.18 e Å−3 |
2068 reflections | Δρmin = −0.23 e Å−3 |
155 parameters | Extinction correction: SHELXL97, Fc*=kFc[1+0.001xFc2λ3/sin(2θ)]-1/4 |
1 restraint | Extinction coefficient: 0.016 (3) |
Primary atom site location: structure-invariant direct methods | Absolute structure: Flack (1983), 942 Friedel Pairs |
Secondary atom site location: difference Fourier map | Absolute structure parameter: −0.05 (8) |
C14H9NOS | V = 595.8 (6) Å3 |
Mr = 239.28 | Z = 2 |
Monoclinic, P21 | Mo Kα radiation |
a = 7.499 (5) Å | µ = 0.25 mm−1 |
b = 7.835 (3) Å | T = 294 K |
c = 10.624 (7) Å | 0.59 × 0.26 × 0.21 mm |
β = 107.37 (8)° |
Siemens P4 four-circle diffractometer | 1816 reflections with I > 2σ(I) |
Absorption correction: psi-scan (XPREP in SHELXTL-Plus; Sheldrick, 1995) | Rint = 0.013 |
Tmin = 0.928, Tmax = 0.947 | 3 standard reflections every 100 reflections |
2572 measured reflections | intensity decay: none |
2068 independent reflections |
R[F2 > 2σ(F2)] = 0.033 | H-atom parameters constrained |
wR(F2) = 0.077 | Δρmax = 0.18 e Å−3 |
S = 1.02 | Δρmin = −0.23 e Å−3 |
2068 reflections | Absolute structure: Flack (1983), 942 Friedel Pairs |
155 parameters | Absolute structure parameter: −0.05 (8) |
1 restraint |
Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell e.s.d.'s are taken into account individually in the estimation of e.s.d.'s in distances, angles and torsion angles; correlations between e.s.d.'s in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
S1 | 0.00671 (8) | 0.46646 (9) | 0.95738 (6) | 0.0590 (2) | |
O1 | −0.2488 (3) | 0.2794 (3) | 0.79479 (18) | 0.0690 (6) | |
C1 | −0.0973 (3) | 0.3421 (3) | 0.8160 (2) | 0.0446 (6) | |
C2 | 0.0193 (3) | 0.3200 (3) | 0.7239 (2) | 0.0423 (5) | |
C3 | −0.0560 (4) | 0.2281 (3) | 0.6093 (3) | 0.0555 (7) | |
H3 | −0.1759 | 0.1834 | 0.5908 | 0.067* | |
C4 | 0.0458 (4) | 0.2023 (4) | 0.5222 (3) | 0.0594 (8) | |
H4 | −0.0053 | 0.1395 | 0.4456 | 0.071* | |
C5 | 0.2223 (4) | 0.2692 (3) | 0.5485 (2) | 0.0535 (6) | |
C51 | 0.3299 (5) | 0.2384 (4) | 0.4577 (3) | 0.0745 (9) | |
N5 | 0.4122 (5) | 0.2126 (5) | 0.3861 (3) | 0.1095 (12) | |
C6 | 0.2980 (3) | 0.3628 (4) | 0.6617 (3) | 0.0572 (7) | |
H6 | 0.4170 | 0.4093 | 0.6791 | 0.069* | |
C7 | 0.1959 (3) | 0.3873 (3) | 0.7492 (2) | 0.0503 (6) | |
H7 | 0.2472 | 0.4498 | 0.8259 | 0.060* | |
C11 | −0.1729 (3) | 0.4720 (4) | 1.0344 (2) | 0.0454 (5) | |
C12 | −0.1510 (4) | 0.3854 (3) | 1.1498 (2) | 0.0531 (6) | |
H12 | −0.0443 | 0.3202 | 1.1858 | 0.064* | |
C13 | −0.2875 (4) | 0.3947 (4) | 1.2132 (2) | 0.0583 (7) | |
H13 | −0.2727 | 0.3348 | 1.2912 | 0.070* | |
C14 | −0.4434 (3) | 0.4912 (4) | 1.1617 (2) | 0.0550 (6) | |
H14 | −0.5350 | 0.4969 | 1.2043 | 0.066* | |
C15 | −0.4649 (4) | 0.5799 (3) | 1.0466 (3) | 0.0542 (6) | |
H15 | −0.5708 | 0.6466 | 1.0120 | 0.065* | |
C16 | −0.3310 (3) | 0.5710 (3) | 0.9820 (2) | 0.0514 (6) | |
H16 | −0.3465 | 0.6309 | 0.9038 | 0.062* |
U11 | U22 | U33 | U12 | U13 | U23 | |
S1 | 0.0491 (3) | 0.0726 (4) | 0.0633 (4) | −0.0142 (4) | 0.0288 (3) | −0.0210 (4) |
O1 | 0.0520 (11) | 0.0935 (16) | 0.0704 (12) | −0.0275 (10) | 0.0318 (10) | −0.0261 (11) |
C1 | 0.0416 (13) | 0.0484 (14) | 0.0470 (13) | −0.0020 (11) | 0.0182 (10) | 0.0013 (11) |
C2 | 0.0423 (12) | 0.0446 (13) | 0.0413 (12) | 0.0009 (10) | 0.0143 (9) | 0.0018 (10) |
C3 | 0.0500 (14) | 0.0653 (17) | 0.0532 (14) | −0.0085 (13) | 0.0186 (12) | −0.0071 (13) |
C4 | 0.064 (2) | 0.0669 (18) | 0.0497 (17) | −0.0013 (15) | 0.0208 (14) | −0.0085 (13) |
C5 | 0.0573 (16) | 0.0627 (16) | 0.0477 (13) | 0.0138 (13) | 0.0267 (13) | 0.0081 (12) |
C51 | 0.077 (2) | 0.090 (2) | 0.0694 (18) | 0.0110 (18) | 0.0426 (17) | 0.0064 (17) |
N5 | 0.125 (3) | 0.135 (3) | 0.099 (2) | 0.013 (2) | 0.080 (2) | −0.004 (2) |
C6 | 0.0429 (13) | 0.0723 (18) | 0.0600 (15) | 0.0008 (13) | 0.0211 (12) | 0.0038 (14) |
C7 | 0.0413 (13) | 0.0662 (15) | 0.0449 (12) | −0.0032 (12) | 0.0149 (10) | −0.0029 (11) |
C11 | 0.0428 (12) | 0.0495 (12) | 0.0475 (11) | −0.0009 (14) | 0.0192 (10) | −0.0096 (13) |
C12 | 0.0530 (14) | 0.0550 (14) | 0.0511 (14) | 0.0079 (12) | 0.0149 (12) | −0.0019 (12) |
C13 | 0.0670 (17) | 0.0646 (16) | 0.0467 (14) | 0.0036 (14) | 0.0224 (13) | 0.0013 (12) |
C14 | 0.0541 (13) | 0.0618 (17) | 0.0568 (14) | −0.0034 (14) | 0.0285 (11) | −0.0142 (14) |
C15 | 0.0479 (14) | 0.0556 (15) | 0.0612 (16) | 0.0038 (12) | 0.0194 (13) | −0.0080 (12) |
C16 | 0.0559 (15) | 0.0516 (15) | 0.0479 (14) | −0.0006 (12) | 0.0176 (12) | −0.0024 (12) |
S1—C1 | 1.765 (3) | C6—H6 | 0.9300 |
S1—C11 | 1.773 (2) | C7—H7 | 0.9300 |
O1—C1 | 1.195 (3) | C11—C12 | 1.368 (3) |
C1—C2 | 1.505 (3) | C11—C16 | 1.387 (3) |
C2—C7 | 1.375 (3) | C12—C13 | 1.385 (3) |
C2—C3 | 1.382 (3) | C12—H12 | 0.9300 |
C3—C4 | 1.379 (4) | C13—C14 | 1.362 (4) |
C3—H3 | 0.9300 | C13—H13 | 0.9300 |
C4—C5 | 1.373 (4) | C14—C15 | 1.373 (4) |
C4—H4 | 0.9300 | C14—H14 | 0.9300 |
C5—C6 | 1.378 (4) | C15—C16 | 1.377 (3) |
C5—C51 | 1.450 (4) | C15—H15 | 0.9300 |
C51—N5 | 1.131 (3) | C16—H16 | 0.9300 |
C6—C7 | 1.383 (3) | ||
C1—S1—C11 | 101.68 (12) | C2—C7—H7 | 119.7 |
O1—C1—C2 | 122.3 (2) | C6—C7—H7 | 119.7 |
O1—C1—S1 | 122.74 (18) | C12—C11—C16 | 119.8 (2) |
C2—C1—S1 | 114.95 (17) | C12—C11—S1 | 119.82 (19) |
C7—C2—C3 | 119.2 (2) | C16—C11—S1 | 120.30 (19) |
C7—C2—C1 | 122.8 (2) | C11—C12—C13 | 120.1 (2) |
C3—C2—C1 | 118.0 (2) | C11—C12—H12 | 120.0 |
C4—C3—C2 | 120.4 (2) | C13—C12—H12 | 120.0 |
C4—C3—H3 | 119.8 | C14—C13—C12 | 120.3 (2) |
C2—C3—H3 | 119.8 | C14—C13—H13 | 119.9 |
C5—C4—C3 | 120.1 (3) | C12—C13—H13 | 119.9 |
C5—C4—H4 | 120.0 | C13—C14—C15 | 119.8 (2) |
C3—C4—H4 | 120.0 | C13—C14—H14 | 120.1 |
C4—C5—C6 | 120.1 (2) | C15—C14—H14 | 120.1 |
C4—C5—C51 | 119.7 (3) | C14—C15—C16 | 120.6 (2) |
C6—C5—C51 | 120.2 (3) | C14—C15—H15 | 119.7 |
N5—C51—C5 | 179.0 (4) | C16—C15—H15 | 119.7 |
C5—C6—C7 | 119.6 (2) | C15—C16—C11 | 119.4 (2) |
C5—C6—H6 | 120.2 | C15—C16—H16 | 120.3 |
C7—C6—H6 | 120.2 | C11—C16—H16 | 120.3 |
C2—C7—C6 | 120.7 (2) |
D—H···A | D—H | H···A | D···A | D—H···A |
C14—H14···O1i | 0.93 | 2.75 | 3.359 (3) | 124 |
C15—H15···O1i | 0.93 | 2.96 | 3.472 (4) | 116 |
C6—H6···O1ii | 0.93 | 2.64 | 3.333 (4) | 132 |
C6—H6···N5iii | 0.93 | 2.88 | 3.626 (4) | 138 |
C13—H13···N5iv | 0.93 | 2.99 | 3.599 (4) | 125 |
Symmetry codes: (i) −x−1, y+1/2, −z+2; (ii) x+1, y, z; (iii) −x+1, y+1/2, −z+1; (iv) x−1, y, z+1. |
Experimental details
Crystal data | |
Chemical formula | C14H9NOS |
Mr | 239.28 |
Crystal system, space group | Monoclinic, P21 |
Temperature (K) | 294 |
a, b, c (Å) | 7.499 (5), 7.835 (3), 10.624 (7) |
β (°) | 107.37 (8) |
V (Å3) | 595.8 (6) |
Z | 2 |
Radiation type | Mo Kα |
µ (mm−1) | 0.25 |
Crystal size (mm) | 0.59 × 0.26 × 0.21 |
Data collection | |
Diffractometer | Siemens P4 four-circle diffractometer |
Absorption correction | Psi-scan (XPREP in SHELXTL-Plus; Sheldrick, 1995) |
Tmin, Tmax | 0.928, 0.947 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 2572, 2068, 1816 |
Rint | 0.013 |
(sin θ/λ)max (Å−1) | 0.596 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.033, 0.077, 1.02 |
No. of reflections | 2068 |
No. of parameters | 155 |
No. of restraints | 1 |
H-atom treatment | H-atom parameters constrained |
Δρmax, Δρmin (e Å−3) | 0.18, −0.23 |
Absolute structure | Flack (1983), 942 Friedel Pairs |
Absolute structure parameter | −0.05 (8) |
Computer programs: R3m/V User's Guide (Siemens, 1989), R3m/V User's Guide, XDISK (Siemens, 1989), SHELXS97 (Sheldrick, 1997), SHELXL97 (Sheldrick, 1997), SHELXTL-Plus (Sheldrick, 1995), SHELXL97.
D—H···A | D—H | H···A | D···A | D—H···A |
C14—H14···O1i | 0.93 | 2.75 | 3.359 (3) | 124 |
C15—H15···O1i | 0.93 | 2.96 | 3.472 (4) | 116 |
C6—H6···O1ii | 0.93 | 2.64 | 3.333 (4) | 132 |
C6—H6···N5iii | 0.93 | 2.88 | 3.626 (4) | 138 |
C13—H13···N5iv | 0.93 | 2.99 | 3.599 (4) | 125 |
Symmetry codes: (i) −x−1, y+1/2, −z+2; (ii) x+1, y, z; (iii) −x+1, y+1/2, −z+1; (iv) x−1, y, z+1. |
In previous papers on the vibrational spectra and theoretical analysis of S-phenyl 4-substituted-thiobenzoates, we have assigned and interpreted the characteristic IR bands and predicted their molecular structures using the possibilities of linear-dichroic infrared spectroscopy (Arnaudov et al., 2003; Ivanova & Arnaudov, 2003). With the goal of comparing an experimental structure with the predictions of IR–LD spectroscopic analysis and ab initio calculations, we have now determined the single-crystal X-ray structure of the title compound, (I).
Molecules of (I) are chiral due to the fact that the S-phenyl ring is twisted by 72.49 (1)° out of the plane of thiocarbonate function to minimize the O1···C16 contact. In contrast, the 4-cyanophenyl ring (C2–C7) is almost coplanar with the central thiocarbonate unit and exhibits an interplanar angle of only 1.81 (2)°. Our IR–LD spectral analysis and ab initio calculations predicted interplanar angles of 90.8 (6) and 0.0 (1)°, respectively. The experimental and theoretical metrical parameters obtained for (I) are closely similar.
Compound (I) crystallizes in the chiral monoclinic space group P21 and participates in very weak intermolecular hydrogen bridges (Table 1). The observed structure of (I) is in good agreement with those determined for other S-phenyl thiobenzoates (Allouchi et al., 1995; Chrusciel et al., 1995; Ganesh et al., 2005; Jovanovski et al., 1993; Karczmarcyk or Karczmarzyk et al., 2001; Low et al., 2000; Sakamoto et al., 1996; Takahashi, Sekine et al., 1998; Takahashi, Fujita et al., 1998).