Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768105030570/og5013sup1.cif | |
Rietveld powder data file (CIF format) https://doi.org/10.1107/S0108768105030570/og5013Isup2.rtv | |
Text file https://doi.org/10.1107/S0108768105030570/og5013sup3.txt |
Precursor sols were prepared from a mixture of 70 wt% zirconium (IV) propoxide 1-propanol solution and 98 wt% triethanolamine. The sols were hydrolyzed with half volume of water in a Teflon-lined autoclave at 110 oC for 24 h and then at 120 oC for 120 h. A white fine powder was separated from the mother solution by a centrifuge and rinsed several times with ethanol. In order to obtain zirconium oxide nanocrystallites, the ethanol sol was dried in air on a quartz plate at 125 oC for 22 h(Tsunekawa et al., 2005b).
The crystal structure of the zirconium oxide nanocrystallites was refined by the Rietveld method with a computer program RIETAN-2000 (Izumi & Ikeda, 2000).
Data collection: RIGAKU software (Toraya et al., 1996) for (I). Cell refinement: RIETAN-2000 (Izumi and Ikeda, 2000) for (I). Program(s) used to solve structure: RIETAN-2000 for (I). Program(s) used to refine structure: RIETAN-2000 for (I). Molecular graphics: VENUS [Izumi and Dilanian (2002)] for (I).
O2−xZr | Dx = 6.159 Mg m−3 |
Mr = 246.49 | Monochromatized synchrotron X-ray 1.20200 radiation, λ = 1.20200 Å |
Tetragonal, P42/nmc | T = 298 K |
a = 3.58651 (8) Å | Particle morphology: plate-like |
c = 5.16658 (15) Å | white |
V = 66.46 (1) Å3 | flat sheet, 12 × 12 mm |
Z = 2 | Specimen preparation: Prepared at 398 K |
F(000) = 111.192 |
A multiple-detector system with Ge(111) analyzer crystals, Soller slits and
scintillation counters (Toraya et al., 1996) diffractometer | Data collection mode: reflection |
Radiation source: synchrotron X-ray | Scan method: step |
Ge(111) analyzer crystals monochromator | 2θmin = 10.501°, 2θmax = 154.808°, 2θstep = 0.01° |
Specimen mounting: packed powder pellet |
Rp = 0.047 | Profile function: a split-type Pearson VII (Toraya, 1990) |
Rwp = 0.061 | 57 (13 for structural parameters) parameters |
Rexp = 0.063 | |
RBragg = 0.009 | Background function: twelve-parameter polynomial in 2thetan, where n has values between 0 and 11 |
χ2 = 1.690 | Preferred orientation correction: no |
14432 data points |
O2−xZr | V = 66.46 (1) Å3 |
Mr = 246.49 | Z = 2 |
Tetragonal, P42/nmc | Monochromatized synchrotron X-ray 1.20200 radiation, λ = 1.20200 Å |
a = 3.58651 (8) Å | T = 298 K |
c = 5.16658 (15) Å | flat sheet, 12 × 12 mm |
A multiple-detector system with Ge(111) analyzer crystals, Soller slits and
scintillation counters (Toraya et al., 1996) diffractometer | Scan method: step |
Specimen mounting: packed powder pellet | 2θmin = 10.501°, 2θmax = 154.808°, 2θstep = 0.01° |
Data collection mode: reflection |
Rp = 0.047 | χ2 = 1.690 |
Rwp = 0.061 | 14432 data points |
Rexp = 0.063 | 57 (13 for structural parameters) parameters |
RBragg = 0.009 |
x | y | z | Uiso*/Ueq | Occ. (<1) | |
Zr0.994Hf0.006 | 0 | 0 | 0 | 0.385 (1)* | |
O | 0 | 0.5 | 0.2042 (2) | 0.934 (17)* | 0.984 (4) |
? | β = 90° |
Mr = ? | γ = 90° |
?, P42/nmc | V = ? Å3 |
a = 3.58651 (8) Å | Z = ? |
b = 3.58651 (8) Å | ? radiation, λ = ? Å |
c = 5.16658 (8) Å | × × mm |
α = 90° |
? | β = 90° |
Mr = ? | γ = 90° |
?, P42/nmc | V = ? Å3 |
a = 3.58651 (8) Å | Z = ? |
b = 3.58651 (8) Å | ? radiation, λ = ? Å |
c = 5.16658 (8) Å | × × mm |
α = 90° |
x | y | z | Biso*/Beq | Occ. (<1) | |
Zr | 0 | 0 | 0 | 0.385 (1)* | |
O | 0 | 0.50000 | 0.2041 (3) | 0.934 (17)* | 0.984 (4) |
Experimental details
(I) | (VICS_phase_1) | |
Crystal data | ||
Chemical formula | O2−xZr | ? |
Mr | 246.49 | ? |
Crystal system, space group | Tetragonal, P42/nmc | ?, P42/nmc |
Temperature (K) | 298 | ? |
a, c (Å) | 3.58651 (8), 5.16658 (15) | 3.58651 (8), 5.16658 (8) |
V (Å3) | 66.46 (1) | ? |
Z | 2 | ? |
Radiation type | Monochromatized synchrotron X-ray 1.20200, λ = 1.20200 Å | ?, λ = ? Å |
µ (mm−1) | – | ? |
Specimen shape, size (mm) | Flat sheet, 12 × 12 | × × |
Data collection | ||
Diffractometer | A multiple-detector system with Ge(111) analyzer crystals, Soller slits and
scintillation counters (Toraya et al., 1996) diffractometer | ? |
Specimen mounting | Packed powder pellet | – |
Data collection mode | Reflection | – |
Data collection method | Step | ? |
Absorption correction | – | ? |
No. of measured, independent and observed reflections | – | ?, ?, ? |
Rint | – | ? |
θ values (°) | 2θmin = 10.501 2θmax = 154.808 2θstep = 0.01 | θmax = ? |
Refinement | ||
R factors and goodness of fit | Rp = 0.047, Rwp = 0.061, Rexp = 0.063, RBragg = 0.009, χ2 = 1.690 | R[F2 > 2σ(F2)] = ?, wR(F2) = ?, S = ? |
No. of reflections/data points | 14432 | ? |
No. of parameters | 57 (13 for structural parameters) | ? |
No. of restraints | ? | ? |
Δρmax, Δρmin (e Å−3) | – | ?, ? |
Computer programs: RIGAKU software (Toraya et al., 1996), RIETAN-2000 (Izumi and Ikeda, 2000), RIETAN-2000, VENUS [Izumi and Dilanian (2002)].