research papers
Accurate structure factors for small crystals of the rutile-type structures CoF2, cobalt difluoride, and ZnF2, zinc difluoride, have been measured with focused λ = 0.8400 (2) Å synchrotron X-radiation at room temperature. Phenomenological structural trends across the full series of rutile-type transition metal difluorides are analysed, showing the importance of the metal atom in the degree of distortion of the metal–F6 octahedra in these structures. Multipole models reveal strong asphericities in the electron density surrounding the transition metals, which are consistent with expectations from crystal field theory and the structural trends in these compounds. Transition metal 3d-orbital populations were computed from the multipole refinement parameters, showing significant repopulation of orbitals compared with the free atom, particularly for CoF2.
Supporting information
Crystallographic Information File (CIF) https://doi.org/10.1107/S0108768100017353/os0063sup1.cif | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768100017353/os0063cof2sup2.hkl | |
Structure factor file (CIF format) https://doi.org/10.1107/S0108768100017353/os0063znf2sup3.hkl |
Computing details top
For both compounds, data reduction: Xtal DIFDAT ADDREF SORTRF ABSORB; program(s) used to solve structure: Xtal; program(s) used to refine structure: Xtal CRYLSQ; molecular graphics: Xtal; software used to prepare material for publication: Xtal CIFIO.
(cof2) top
Crystal data top
CoF2 | Dx = 4.592 Mg m−3 |
Mr = 12.12 | Synchrotron radiation, λ = 0.84 Å |
Tetragonal, P42/mnm | Cell parameters from 6 reflections |
Hall symbol: -P 4n 2n | θ = 45.7–52.4° |
a = 4.6956 (5) Å | µ = 18.22 mm−1 |
c = 3.1793 (3) Å | T = 293 K |
V = 70.10 (2) Å3 | Rectangular, pink |
Z = 16 | × × mm |
F(000) = 90 |
Data collection top
BL14A Four circle diffractometer | 2502 reflections with I > 2σ(I) |
Radiation source: Photon Factory BL14A | Rint = 0.039 |
Si(111) monochromator | θmax = 67.4°, θmin = 7.3° |
ω–2θ scans | h = −10→10 |
Absorption correction: analytical ? | k = −10→10 |
Tmin = 0.801, Tmax = 0.864 | l = −6→6 |
2883 measured reflections | 6 standard reflections every 94 reflections |
2883 independent reflections | intensity decay: 3% |
Refinement top
Refinement on F | 0 constraints |
Least-squares matrix: full | w = 1/σ2(F) |
R[F2 > 2σ(F2)] = 0.019 | (Δ/σ)max = 0.00005 |
wR(F2) = 0.015 | Δρmax = 1.17 e Å−3 |
S = 2.42 | Δρmin = −1.07 e Å−3 |
235 reflections | Extinction correction: Zachariasen, Eq22 p292 "Cryst. Comp." Munksgaard 1970 |
9 parameters | Extinction coefficient: 9132 (847) |
0 restraints |
Crystal data top
CoF2 | Z = 16 |
Mr = 12.12 | Synchrotron radiation, λ = 0.84 Å |
Tetragonal, P42/mnm | µ = 18.22 mm−1 |
a = 4.6956 (5) Å | T = 293 K |
c = 3.1793 (3) Å | × × mm |
V = 70.10 (2) Å3 |
Data collection top
BL14A Four circle diffractometer | 2502 reflections with I > 2σ(I) |
Absorption correction: analytical ? | Rint = 0.039 |
Tmin = 0.801, Tmax = 0.864 | 6 standard reflections every 94 reflections |
2883 measured reflections | intensity decay: 3% |
2883 independent reflections |
Refinement top
R[F2 > 2σ(F2)] = 0.019 | 9 parameters |
wR(F2) = 0.015 | 0 restraints |
S = 2.42 | Δρmax = 1.17 e Å−3 |
235 reflections | Δρmin = −1.07 e Å−3 |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
x | y | z | Uiso*/Ueq | ||
Co | 0.00000 | 0.00000 | 0.00000 | 0.00634 (4) | |
F | 0.30341 (11) | 0.30341 (11) | 0.00000 | 0.01063 (17) |
Atomic displacement parameters (Å2) top
U11 | U22 | U33 | U12 | U13 | U23 | |
Co | 0.00685 (3) | 0.00685 (3) | 0.00533 (5) | −0.00073 (5) | 0.00000 | 0.00000 |
F | 0.01194 (15) | 0.01194 (15) | 0.0080 (2) | −0.0053 (2) | 0.00000 | 0.00000 |
(znf2) top
Crystal data top
ZnF2 | Dx = 4.952 Mg m−3 |
Mr = 12.92 | Synchrotron radiation, λ = 0.84 Å |
Tetragonal, P42/mnm | Cell parameters from 6 reflections |
Hall symbol: -P 4n 2n | θ = 45.6–53.5° |
a = 4.7038 (15) Å | µ = 26.55 mm−1 |
c = 3.1336 (7) Å | T = 293 K |
V = 69.33 (5) Å3 | Rectangular, clear |
Z = 16 | × × mm |
F(000) = 96 |
Data collection top
BL14A Four circle diffractometer | 2460 reflections with I > 2σ(I) |
Radiation source: Photon Factory BL14A | Rint = 0.04 |
Si(111) monochromator | θmax = 67.5°, θmin = 7.3° |
ω–2θ scans | h = −10→10 |
Absorption correction: analytical ? | k = −10→10 |
Tmin = 0.527, Tmax = 0.754 | l = −6→6 |
2727 measured reflections | 6 standard reflections every 94 reflections |
2727 independent reflections | intensity decay: 3% |
Refinement top
Refinement on F | 0 constraints |
Least-squares matrix: full | w = 1/σ2(F) |
R[F2 > 2σ(F2)] = 0.014 | (Δ/σ)max = 0.00013 |
wR(F2) = 0.016 | Δρmax = 0.72 e Å−3 |
S = 2.39 | Δρmin = −0.68 e Å−3 |
237 reflections | Extinction correction: Zachariasen, Eq22 p292 "Cryst. Comp." Munksgaard 1970 |
9 parameters | Extinction coefficient: 3273 (120) |
0 restraints |
Crystal data top
ZnF2 | Z = 16 |
Mr = 12.92 | Synchrotron radiation, λ = 0.84 Å |
Tetragonal, P42/mnm | µ = 26.55 mm−1 |
a = 4.7038 (15) Å | T = 293 K |
c = 3.1336 (7) Å | × × mm |
V = 69.33 (5) Å3 |
Data collection top
BL14A Four circle diffractometer | 2460 reflections with I > 2σ(I) |
Absorption correction: analytical ? | Rint = 0.04 |
Tmin = 0.527, Tmax = 0.754 | 6 standard reflections every 94 reflections |
2727 measured reflections | intensity decay: 3% |
2727 independent reflections |
Refinement top
R[F2 > 2σ(F2)] = 0.014 | 9 parameters |
wR(F2) = 0.016 | 0 restraints |
S = 2.39 | Δρmax = 0.72 e Å−3 |
237 reflections | Δρmin = −0.68 e Å−3 |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
x | y | z | Uiso*/Ueq | ||
Zn | 0.00000 | 0.00000 | 0.00000 | 0.00876 (5) | |
F | 0.30350 (9) | 0.30350 (9) | 0.00000 | 0.01231 (12) |
Atomic displacement parameters (Å2) top
U11 | U22 | U33 | U12 | U13 | U23 | |
Zn | 0.00917 (4) | 0.00917 (4) | 0.00793 (7) | −0.00111 (3) | 0.00000 | 0.00000 |
F | 0.01307 (10) | 0.01307 (10) | 0.01080 (17) | −0.00515 (17) | 0.00000 | 0.00000 |
Experimental details
(cof2) | (znf2) | |
Crystal data | ||
Chemical formula | CoF2 | ZnF2 |
Mr | 12.12 | 12.92 |
Crystal system, space group | Tetragonal, P42/mnm | Tetragonal, P42/mnm |
Temperature (K) | 293 | 293 |
a, c (Å) | 4.6956 (5), 3.1793 (3) | 4.7038 (15), 3.1336 (7) |
V (Å3) | 70.10 (2) | 69.33 (5) |
Z | 16 | 16 |
Radiation type | Synchrotron, λ = 0.84 Å | Synchrotron, λ = 0.84 Å |
µ (mm−1) | 18.22 | 26.55 |
Crystal size (mm) | × × | × × |
Data collection | ||
Diffractometer | BL14A Four circle diffractometer | BL14A Four circle diffractometer |
Absorption correction | Analytical | Analytical |
Tmin, Tmax | 0.801, 0.864 | 0.527, 0.754 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 2883, 2883, 2502 | 2727, 2727, 2460 |
Rint | 0.039 | 0.04 |
(sin θ/λ)max (Å−1) | 1.099 | 1.100 |
Refinement | ||
R[F2 > 2σ(F2)], wR(F2), S | 0.019, 0.015, 2.42 | 0.014, 0.016, 2.39 |
No. of reflections | 235 | 237 |
No. of parameters | 9 | 9 |
Δρmax, Δρmin (e Å−3) | 1.17, −1.07 | 0.72, −0.68 |
Computer programs: Xtal DIFDAT ADDREF SORTRF ABSORB, Xtal CRYLSQ, Xtal CIFIO.