Observation of background contrast in convergent beam patterns

The relation of inelastic scattered intensity to the main elastically scattered pattern may be observed in convergent-beam patterns, with regard to incident and scattered directions and crystal thickness, and qualitatively compared with theory. The contribution of inelastic scattering to absorption and other measurements can be relatively easily estimated due to the sharp separation of the diffraction aperture, and the convergent beam method has this advantage over electron-microscope imaging.