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The calculation of amplitudes and phases of beams of electrons diffracted from thin (≤ 100 nm) crystals of W4Nb26O77 is described. These diffraction data are used to compute 11-beam 00l electron microscope lattice images and the effects of instrument aberrations are considered. Several approximations are compared with a more exact 435-beam, two-dimensional computation, and with experimental diffraction data and lattice images. Finally, the projected charge density approximation to image contrast is evaluated.
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