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The wavelength dependence of Si structure factors was measured by the Pendellösung method described in the paper of Saka & Kato [Acta Cryst. (1986). A42, 469-478] in the range from 0.8 down to 0.3 Å with an accuracy level better than 0.05% in most cases. The same conclusion as Takeda & Kato [Acta Cryst. (1978). A34, 43-47] was obtained; namely that Cromer & Liberman's theory of anomalous dispersion [Cromer & Liberman (1970). J. Chem. Phys. 53, 1891-1898] is essentially correct. As a consequence Jensen's magnetic-scattering term [Jensen (1979). Phys. Lett. A, 74, 41-44] is not acceptable.

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