Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method

Ida, T.

doi:10.1107/S1600576720005130

Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method

Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X-ray detector in continuous-scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.

Keywords: equatorial aberration; powder diffraction; Si strip detectors; Bragg–Brentano geometry; instrumental function.

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Equatorial aberration of powder diffraction data collected with an Si strip X-ray detector by a continuous-scan integration method

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