
Cu/Zn disorder in the kesterite Cu2ZnSnS4 derivatives used for thin film based solar cells is an important issue for photovoltaic performances. Unfortunately, Cu and Zn cannot be distinguished by conventional laboratory X-ray diffraction. This paper reports on a resonant diffraction investigation of a Cu2ZnSnS4 single crystal from a quenched powdered sample. The full disorder of Cu and Zn in the z = 1/4 atomic plane is shown. The structure, namely disordered kesterite, is then described in the
space group.
Supporting information
![]() | Crystallographic Information File (CIF) https://doi.org/10.1107/S2052520614003138/dk5022sup1.cif |
![]() | Structure factor file (CIF format) https://doi.org/10.1107/S2052520614003138/dk5022Isup2.hkl |
CCDC reference: 986377
Refinement
Crystal data, data collection and structure refinement details are summarized in Table 1.
Computing details top
Data collection: unknown; cell refinement: unknown; data reduction: unknown; program(s) used to solve structure: unknown; molecular graphics: unknown.
(I) top
Crystal data top
Cu2S4SnZn | Z = 2 |
Mr = 439.4 | F(000) = 404 |
Tetragonal, I42m | Dx = 4.553 Mg m−3 |
Hall symbol: I -4 2 | ? radiation, λ = 0.66842 Å |
a = 5.4353 (1) Å | µ = 12.84 mm−1 |
c = 10.8464 (3) Å | T = 293 K |
V = 320.43 (1) Å3 | 0.08 × 0.05 × 0.05 mm |
Data collection top
Radiation source: synchrotron | Rint = 0.088 |
Absorption correction: empirical (using intensity measurements) ? | θmax = 34.7°, θmin = 3.5° |
Tmin = 0.91, Tmax = 1.10 | h = −6→8 |
5275 measured reflections | k = −9→9 |
449 independent reflections | l = −18→18 |
449 reflections with I > 2σ(I) |
Refinement top
Refinement on F2 | 2 constraints |
R[F2 > 2σ(F2)] = 0.029 | Weighting scheme based on measured s.u.'s w = 1/(σ2(I) + 0.0016I2) |
wR(F2) = 0.074 | (Δ/σ)max = 0.004 |
S = 1.60 | Δρmax = 1.39 e Å−3 |
449 reflections | Δρmin = −2.17 e Å−3 |
15 parameters | Extinction correction: B-C type 1 Gaussian isotropic (Becker & Coppens, 1974) |
0 restraints | Extinction coefficient: 1900 (150) |
Crystal data top
Cu2S4SnZn | Z = 2 |
Mr = 439.4 | ? radiation, λ = 0.66842 Å |
Tetragonal, I42m | µ = 12.84 mm−1 |
a = 5.4353 (1) Å | T = 293 K |
c = 10.8464 (3) Å | 0.08 × 0.05 × 0.05 mm |
V = 320.43 (1) Å3 |
Data collection top
Absorption correction: empirical (using intensity measurements) ? | 449 independent reflections |
Tmin = 0.91, Tmax = 1.10 | 449 reflections with I > 2σ(I) |
5275 measured reflections | Rint = 0.088 |
Refinement top
R[F2 > 2σ(F2)] = 0.029 | 15 parameters |
wR(F2) = 0.074 | 0 restraints |
S = 1.60 | Δρmax = 1.39 e Å−3 |
449 reflections | Δρmin = −2.17 e Å−3 |
Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
x | y | z | Uiso*/Ueq | Occ. (<1) | |
Cu_2a | 0 | 0 | 0 | 0.01903 (16) | |
Cu_4d | 0 | 0.5 | 0.25 | 0.01688 (13) | 0.5 |
Zn_4d | 0 | 0.5 | 0.25 | 0.01688 (13) | 0.5 |
Sn_2b | 0 | 0 | 0.5 | 0.01077 (9) | |
S | 0.75608 (10) | 0.24393 (10) | 0.12788 (5) | 0.0112 (2) |
Atomic displacement parameters (Å2) top
U11 | U22 | U33 | U12 | U13 | U23 | |
Cu_2a | 0.0194 (2) | 0.0194 (2) | 0.0183 (3) | 0 | 0 | 0 |
Cu_4d | 0.0170 (2) | 0.0170 (2) | 0.0166 (3) | 0 | 0 | 0 |
Zn_4d | 0.0170 (2) | 0.0170 (2) | 0.0166 (3) | 0 | 0 | 0 |
Sn_2b | 0.01111 (15) | 0.01111 (15) | 0.01008 (17) | 0 | 0 | 0 |
S | 0.0114 (3) | 0.0114 (3) | 0.0108 (4) | 0.00056 (18) | −0.00023 (13) | 0.00023 (13) |
Geometric parameters (Å, º) top
Cu_2a—Si | 2.3322 (6) | Zn_4d—Si | 2.3344 (5) |
Cu_2a—Sii | 2.3322 (6) | Zn_4d—Sv | 2.3344 (5) |
Cu_2a—Siii | 2.3322 (6) | Zn_4d—Svi | 2.3344 (5) |
Cu_2a—Siv | 2.3322 (6) | Zn_4d—Svii | 2.3344 (5) |
Cu_4d—Zn_4d | 0 | Sn_2b—Sviii | 2.4080 (6) |
Cu_4d—Si | 2.3344 (5) | Sn_2b—Six | 2.4080 (6) |
Cu_4d—Sv | 2.3344 (5) | Sn_2b—Sx | 2.4080 (6) |
Cu_4d—Svi | 2.3344 (5) | Sn_2b—Svii | 2.4080 (6) |
Cu_4d—Svii | 2.3344 (5) | ||
Si—Cu_2a—Sii | 107.01 (2) | Sv—Zn_4d—Svii | 108.781 (19) |
Si—Cu_2a—Siii | 110.713 (19) | Svi—Zn_4d—Svii | 110.86 (2) |
Si—Cu_2a—Siv | 110.713 (19) | Sviii—Sn_2b—Six | 109.658 (19) |
Sii—Cu_2a—Siii | 110.713 (19) | Sviii—Sn_2b—Sx | 109.378 (18) |
Sii—Cu_2a—Siv | 110.713 (19) | Sviii—Sn_2b—Svii | 109.378 (18) |
Siii—Cu_2a—Siv | 107.01 (2) | Six—Sn_2b—Sx | 109.378 (18) |
Zn_4d—Cu_4d—Si | 0 | Six—Sn_2b—Svii | 109.378 (18) |
Zn_4d—Cu_4d—Sv | 0 | Sx—Sn_2b—Svii | 109.658 (19) |
Zn_4d—Cu_4d—Svi | 0 | Cu_2axi—S—Cu_4dxi | 110.70 (2) |
Zn_4d—Cu_4d—Svii | 0 | Cu_2axi—S—Cu_4dxii | 110.70 (2) |
Si—Cu_4d—Sv | 110.86 (2) | Cu_2axi—S—Zn_4dxi | 110.70 (2) |
Si—Cu_4d—Svi | 108.781 (19) | Cu_2axi—S—Zn_4dxii | 110.70 (2) |
Si—Cu_4d—Svii | 108.781 (19) | Cu_2axi—S—Sn_2bxiii | 108.34 (2) |
Sv—Cu_4d—Svi | 108.781 (19) | Cu_4dxi—S—Cu_4dxii | 110.81 (2) |
Sv—Cu_4d—Svii | 108.781 (19) | Cu_4dxi—S—Zn_4dxi | 0.0 (5) |
Svi—Cu_4d—Svii | 110.86 (2) | Cu_4dxi—S—Zn_4dxii | 110.81 (2) |
Cu_4d—Zn_4d—Si | 0 | Cu_4dxi—S—Sn_2bxiii | 108.09 (2) |
Cu_4d—Zn_4d—Sv | 0 | Cu_4dxii—S—Zn_4dxi | 110.81 (2) |
Cu_4d—Zn_4d—Svi | 0 | Cu_4dxii—S—Zn_4dxii | 0.0 (5) |
Cu_4d—Zn_4d—Svii | 0 | Cu_4dxii—S—Sn_2bxiii | 108.09 (2) |
Si—Zn_4d—Sv | 110.86 (2) | Zn_4dxi—S—Zn_4dxii | 110.81 (2) |
Si—Zn_4d—Svi | 108.781 (19) | Zn_4dxi—S—Sn_2bxiii | 108.09 (2) |
Si—Zn_4d—Svii | 108.781 (19) | Zn_4dxii—S—Sn_2bxiii | 108.09 (2) |
Sv—Zn_4d—Svi | 108.781 (19) |
Symmetry codes: (i) x−1, y, z; (ii) −x+1, −y, z; (iii) y, −x+1, −z; (iv) −y, x−1, −z; (v) −x+1, −y+1, z; (vi) y−1/2, −x+3/2, −z+1/2; (vii) −y+1/2, x−1/2, −z+1/2; (viii) x−1/2, y−1/2, z+1/2; (ix) −x+1/2, −y+1/2, z+1/2; (x) y−1/2, −x+1/2, −z+1/2; (xi) x+1, y, z; (xii) −x+1/2, y−1/2, −z+1/2; (xiii) x+1/2, y+1/2, z−1/2. |
Experimental details
Crystal data | |
Chemical formula | Cu2S4SnZn |
Mr | 439.4 |
Crystal system, space group | Tetragonal, I42m |
Temperature (K) | 293 |
a, c (Å) | 5.4353 (1), 10.8464 (3) |
V (Å3) | 320.43 (1) |
Z | 2 |
Radiation type | ?, λ = 0.66842 Å |
µ (mm−1) | 12.84 |
Crystal size (mm) | 0.08 × 0.05 × 0.05 |
Data collection | |
Diffractometer | ? |
Absorption correction | Empirical (using intensity measurements) |
Tmin, Tmax | 0.91, 1.10 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 5275, 449, 449 |
Rint | 0.088 |
(sin θ/λ)max (Å−1) | 0.851 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.029, 0.074, 1.60 |
No. of reflections | 449 |
No. of parameters | 15 |
Δρmax, Δρmin (e Å−3) | 1.39, −2.17 |
Computer programs: unknown.