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A new technique, `topo-tomography', suitable for the characterization of the three-dimensional defect structure in bulk crystals, is proposed. The technique consists of the combination of diffraction topography and microtomography. It is applicable to high-quality single crystals, provided that the `direct image' is the dominant contrast mechanism. In this case, crystal defects give rise to locally enhanced intensity compared with the perfect-crystal matrix. The additional intensities sum along the diffracted-beam direction and yield projections of the local Bragg reflectivity. Like in the case of absorption tomography, the three-dimensional distribution of this reflectivity can be reconstructed from a large number of projections. The first experimental results of this technique, applied to a synthetic diamond crystal, are presented.

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