

Supporting information
![]() | Crystallographic Information File (CIF) https://doi.org/10.1107/S1600536812044820/xu5634sup1.cif |
![]() | Structure factor file (CIF format) https://doi.org/10.1107/S1600536812044820/xu5634Isup2.hkl |
![]() | Chemical Markup Language (CML) file https://doi.org/10.1107/S1600536812044820/xu5634Isup3.cml |
CCDC reference: 914386
Key indicators
- Single-crystal X-ray study
- T = 293 K
- Mean
(C-C) = 0.004 Å
- R factor = 0.030
- wR factor = 0.060
- Data-to-parameter ratio = 10.1
checkCIF/PLATON results
No syntax errors found
Alert level B Crystal system given = orthorhombic PLAT431_ALERT_2_B Short Inter HL..A Contact Cl .. N3 . 2.82 Ang. PLAT915_ALERT_3_B Low Friedel Pair Coverage ...................... 50 Perc.
Alert level C PLAT340_ALERT_3_C Low Bond Precision on C-C Bonds ............... 0.0042 Ang
Alert level G REFLT03_ALERT_4_G WARNING: Large fraction of Friedel related reflns may be needed to determine absolute structure From the CIF: _diffrn_reflns_theta_max 25.19 From the CIF: _reflns_number_total 918 Count of symmetry unique reflns 643 Completeness (_total/calc) 142.77% TEST3: Check Friedels for noncentro structure Estimate of Friedel pairs measured 275 Fraction of Friedel pairs measured 0.428 Are heavy atom types Z>Si present yes PLAT005_ALERT_5_G No _iucr_refine_instructions_details in the CIF ? PLAT093_ALERT_1_G No su's on H-positions, refinement reported as . mixed PLAT158_ALERT_4_G The Input Unitcell is NOT Standard/Reduced ..... ? PLAT199_ALERT_1_G Check the Reported _cell_measurement_temperature 293 K PLAT200_ALERT_1_G Check the Reported _diffrn_ambient_temperature 293 K PLAT850_ALERT_4_G Check Flack Parameter Exact Value 0.00 and su .. 0.08 PLAT909_ALERT_3_G Percentage of Observed Data at Theta(Max) still 84 Perc. PLAT961_ALERT_5_G Dataset Contains no Negative Intensities ....... !
0 ALERT level A = Most likely a serious problem - resolve or explain 2 ALERT level B = A potentially serious problem, consider carefully 1 ALERT level C = Check. Ensure it is not caused by an omission or oversight 9 ALERT level G = General information/check it is not something unexpected 3 ALERT type 1 CIF construction/syntax error, inconsistent or missing data 1 ALERT type 2 Indicator that the structure model may be wrong or deficient 3 ALERT type 3 Indicator that the structure quality may be low 3 ALERT type 4 Improvement, methodology, query or suggestion 2 ALERT type 5 Informative message, check
To a stirring solution of benzotriazole (10 g) in 50 ml of 50% acetic acid aqueous solution was added sodium hypochlorite solution (30 ml) at room temperature dropwise. After dropping, the solution was diluted with water (100 ml) to precipitate the product. The mixture was filtered, washed with water to afford 1-chloro-1H-benzo[d][1,2,3]triazole (8.5 g)as white solid. The single crystals of 1-chloro-1H-benzo[d][1,2,3]triazole were recrystallized from acetone at room temperature.
H atoms were included in idealized positions and refined using a riding-model approximation, with C—H = 0.93 Å and Uiso(H) = 1.2Ueq(C).
Data collection: CrysAlis PRO (Agilent, 2010); cell refinement: CrysAlis PRO (Agilent, 2010); data reduction: CrysAlis PRO (Agilent, 2010); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: OLEX2 (Dolomanov et al., 2009); software used to prepare material for publication: publCIF (Westrip, 2010).
![]() | Fig. 1. The title compound with displacement ellipsoids drawn at the 50% probability level. |
![]() | Fig. 2. Plane-to-plane stacking of alternate molecules parallel to the α axis. |
C6H4ClN3 | Dx = 1.525 Mg m−3 |
Mr = 153.57 | Mo Kα radiation, λ = 0.71073 Å |
Orthorhombic, Fdd2 | Cell parameters from 738 reflections |
a = 22.8022 (11) Å | θ = 3.0–28.5° |
b = 14.2637 (8) Å | µ = 0.48 mm−1 |
c = 8.2259 (4) Å | T = 293 K |
V = 2675.4 (2) Å3 | Block, colourless |
Z = 16 | 0.42 × 0.34 × 0.32 mm |
F(000) = 1248 |
Agilent Xcalibur Eos diffractometer | 918 independent reflections |
Radiation source: fine-focus sealed tube | 867 reflections with I > 2σ(I) |
Graphite monochromator | Rint = 0.017 |
Detector resolution: 16.0874 pixels mm-1 | θmax = 25.2°, θmin = 3.0° |
ω scans | h = −15→27 |
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) | k = −16→8 |
Tmin = 0.979, Tmax = 1.000 | l = −9→9 |
1503 measured reflections |
Refinement on F2 | Secondary atom site location: difference Fourier map |
Least-squares matrix: full | Hydrogen site location: inferred from neighbouring sites |
R[F2 > 2σ(F2)] = 0.030 | H-atom parameters constrained |
wR(F2) = 0.060 | w = 1/[σ2(Fo2) + (0.0242P)2] where P = (Fo2 + 2Fc2)/3 |
S = 1.06 | (Δ/σ)max = 0.001 |
918 reflections | Δρmax = 0.15 e Å−3 |
91 parameters | Δρmin = −0.16 e Å−3 |
1 restraint | Absolute structure: Flack (1983), 275 Friedel pairs |
Primary atom site location: structure-invariant direct methods | Absolute structure parameter: 0.00 (8) |
C6H4ClN3 | V = 2675.4 (2) Å3 |
Mr = 153.57 | Z = 16 |
Orthorhombic, Fdd2 | Mo Kα radiation |
a = 22.8022 (11) Å | µ = 0.48 mm−1 |
b = 14.2637 (8) Å | T = 293 K |
c = 8.2259 (4) Å | 0.42 × 0.34 × 0.32 mm |
Agilent Xcalibur Eos diffractometer | 918 independent reflections |
Absorption correction: multi-scan (CrysAlis PRO; Agilent, 2010) | 867 reflections with I > 2σ(I) |
Tmin = 0.979, Tmax = 1.000 | Rint = 0.017 |
1503 measured reflections |
R[F2 > 2σ(F2)] = 0.030 | H-atom parameters constrained |
wR(F2) = 0.060 | Δρmax = 0.15 e Å−3 |
S = 1.06 | Δρmin = −0.16 e Å−3 |
918 reflections | Absolute structure: Flack (1983), 275 Friedel pairs |
91 parameters | Absolute structure parameter: 0.00 (8) |
1 restraint |
Geometry. All esds (except the esd in the dihedral angle between two l.s. planes) are estimated using the full covariance matrix. The cell esds are taken into account individually in the estimation of esds in distances, angles and torsion angles; correlations between esds in cell parameters are only used when they are defined by crystal symmetry. An approximate (isotropic) treatment of cell esds is used for estimating esds involving l.s. planes. |
Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > 2sigma(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger. |
x | y | z | Uiso*/Ueq | ||
Cl | 0.31785 (3) | 0.13250 (5) | −0.13509 (9) | 0.0508 (2) | |
N1 | 0.37734 (9) | 0.18891 (16) | −0.0618 (3) | 0.0436 (6) | |
N2 | 0.43133 (10) | 0.15132 (19) | −0.0788 (3) | 0.0544 (7) | |
N3 | 0.46849 (10) | 0.20933 (18) | −0.0121 (4) | 0.0537 (7) | |
C1 | 0.37873 (11) | 0.27246 (19) | 0.0179 (3) | 0.0369 (6) | |
C2 | 0.43801 (11) | 0.2849 (2) | 0.0484 (3) | 0.0402 (7) | |
C3 | 0.45739 (14) | 0.3651 (2) | 0.1311 (4) | 0.0538 (8) | |
H3 | 0.4969 | 0.3751 | 0.1531 | 0.065* | |
C4 | 0.41526 (15) | 0.4282 (2) | 0.1780 (4) | 0.0577 (9) | |
H4 | 0.4265 | 0.4822 | 0.2330 | 0.069* | |
C5 | 0.35617 (14) | 0.4133 (2) | 0.1453 (4) | 0.0550 (8) | |
H5 | 0.3292 | 0.4581 | 0.1796 | 0.066* | |
C6 | 0.33580 (13) | 0.3357 (2) | 0.0649 (4) | 0.0459 (8) | |
H6 | 0.2962 | 0.3262 | 0.0435 | 0.055* |
U11 | U22 | U33 | U12 | U13 | U23 | |
Cl | 0.0413 (4) | 0.0522 (4) | 0.0587 (4) | −0.0073 (4) | −0.0014 (4) | −0.0109 (4) |
N1 | 0.0307 (12) | 0.0452 (15) | 0.0549 (15) | −0.0005 (12) | −0.0016 (12) | −0.0116 (13) |
N2 | 0.0396 (15) | 0.0519 (17) | 0.072 (2) | 0.0078 (12) | 0.0062 (13) | −0.0114 (15) |
N3 | 0.0327 (12) | 0.0566 (16) | 0.0719 (16) | 0.0032 (14) | −0.0019 (13) | −0.0092 (13) |
C1 | 0.0367 (15) | 0.0383 (16) | 0.0358 (14) | 0.0036 (14) | −0.0016 (12) | 0.0000 (13) |
C2 | 0.0368 (15) | 0.0404 (16) | 0.0434 (14) | −0.0002 (13) | −0.0010 (14) | 0.0022 (13) |
C3 | 0.0494 (18) | 0.057 (2) | 0.0545 (19) | −0.0129 (16) | −0.010 (2) | −0.0014 (17) |
C4 | 0.079 (2) | 0.0376 (18) | 0.0566 (19) | −0.0060 (18) | −0.002 (2) | −0.0069 (15) |
C5 | 0.0570 (19) | 0.0439 (19) | 0.064 (2) | 0.0099 (16) | 0.0071 (18) | −0.0067 (18) |
C6 | 0.0385 (15) | 0.0440 (19) | 0.0551 (18) | 0.0071 (14) | −0.0006 (14) | −0.0004 (16) |
Cl—N1 | 1.688 (2) | C3—C4 | 1.371 (4) |
N1—N2 | 1.350 (3) | C3—H3 | 0.9300 |
N1—C1 | 1.360 (3) | C4—C5 | 1.390 (4) |
N2—N3 | 1.305 (3) | C4—H4 | 0.9300 |
N3—C2 | 1.376 (4) | C5—C6 | 1.371 (4) |
C1—C2 | 1.386 (3) | C5—H5 | 0.9300 |
C1—C6 | 1.386 (4) | C6—H6 | 0.9300 |
C2—C3 | 1.403 (4) | ||
N2—N1—C1 | 112.1 (2) | C4—C3—H3 | 121.6 |
N2—N1—Cl | 120.4 (2) | C2—C3—H3 | 121.6 |
C1—N1—Cl | 127.46 (18) | C3—C4—C5 | 121.6 (3) |
N3—N2—N1 | 107.3 (2) | C3—C4—H4 | 119.2 |
N2—N3—C2 | 108.7 (2) | C5—C4—H4 | 119.2 |
N1—C1—C2 | 102.8 (2) | C6—C5—C4 | 123.0 (3) |
N1—C1—C6 | 133.5 (3) | C6—C5—H5 | 118.5 |
C2—C1—C6 | 123.7 (3) | C4—C5—H5 | 118.5 |
N3—C2—C1 | 109.1 (3) | C5—C6—C1 | 114.9 (3) |
N3—C2—C3 | 131.0 (3) | C5—C6—H6 | 122.5 |
C1—C2—C3 | 120.0 (3) | C1—C6—H6 | 122.5 |
C4—C3—C2 | 116.8 (3) |
Experimental details
Crystal data | |
Chemical formula | C6H4ClN3 |
Mr | 153.57 |
Crystal system, space group | Orthorhombic, Fdd2 |
Temperature (K) | 293 |
a, b, c (Å) | 22.8022 (11), 14.2637 (8), 8.2259 (4) |
V (Å3) | 2675.4 (2) |
Z | 16 |
Radiation type | Mo Kα |
µ (mm−1) | 0.48 |
Crystal size (mm) | 0.42 × 0.34 × 0.32 |
Data collection | |
Diffractometer | Agilent Xcalibur Eos diffractometer |
Absorption correction | Multi-scan (CrysAlis PRO; Agilent, 2010) |
Tmin, Tmax | 0.979, 1.000 |
No. of measured, independent and observed [I > 2σ(I)] reflections | 1503, 918, 867 |
Rint | 0.017 |
(sin θ/λ)max (Å−1) | 0.599 |
Refinement | |
R[F2 > 2σ(F2)], wR(F2), S | 0.030, 0.060, 1.06 |
No. of reflections | 918 |
No. of parameters | 91 |
No. of restraints | 1 |
H-atom treatment | H-atom parameters constrained |
Δρmax, Δρmin (e Å−3) | 0.15, −0.16 |
Absolute structure | Flack (1983), 275 Friedel pairs |
Absolute structure parameter | 0.00 (8) |
Computer programs: CrysAlis PRO (Agilent, 2010), SHELXS97 (Sheldrick, 2008), SHELXL97 (Sheldrick, 2008), OLEX2 (Dolomanov et al., 2009), publCIF (Westrip, 2010).
Benzotriazole derivates are an important class of heterocylic compounds with essential applications in the organic synthesis and medicinal chemistry. In the synthetic chemistry, 1-chloro-1H-benzo[d][1,2,3]triazole is an important oxidation and chlorination reagent. Recently, 1-chloro-1H-benzo[d][1,2,3]triazole has been used in the synthesis of unsymmetrical disulfides (Hunter et al., 2006). Meanwhile, benzotriazole derivates derivates exhibit numerous essential bioactivitities, especially in antimicrobial (Gaikwad, et al., 2012) and antibubercular activities (Dubey et al. 2011). Most recently, several crystal structures of title compound derivates have been reported (Jebas et al., 2012; Guo et al., 2012; Selvarathy et al., 2012; Xu & Shen 2012), but crystal data of 1-chloro-1H-benzo[d][1,2,3]triazole has not been investigated. Herein, we report the synthesis and crystal structure of the title compound.
The molecular structure of 1-chloro-1H-benzo[d][1,2,3]triazole is shown in Fig. 1. The bond lengths and angles are within normal ranges. In the crystal, the short contact of 2.818 (3) Å between N and Cl atoms of adjacent molecules occurs.