issue contents

Journal logoJOURNAL OF
ISSN: 1600-5775

January 1999 issue

Highlighted illustration

Cover illustration: The 4 × 4 array of CCD X-ray detectors called the multiple charge-coupled-device X-ray detector (MCCDX), which is currently under commissioning at the SPring-8 facility in Japan, see Suzuki, Yamamoto, Kumasaka, Sato, Toyokawa, Aries, Jerram, Gullick and Ueki, pages 6-18.

facility information

research papers

J. Synchrotron Rad. (1999). 6, 1-5
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A solft X-ray beam-position monitor based on a CVD diamond photodetector is presented, for use on low-energy monochromatic beamlines. It allows monitoring of beam instabilities during experiments towards simultaneous compensation.

J. Synchrotron Rad. (1999). 6, 6-18
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This paper describes the design concept of a multiple-CCD X-ray detector as well as the initial performance test carried out with a conventional X-ray generator system.

J. Synchrotron Rad. (1999). 6, 19-28
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Ab initio structure determination of three organic compounds prove that the Laue method can be used as a stand-alone technique for X-ray analysis.

J. Synchrotron Rad. (1999). 6, 29-33
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Hybrid reflections appearing in the high-resolution sychrotron-radiation Renninger scans have been used to observe the break in the lattice coherence for the InGaP/GaAs heterostructure system.

J. Synchrotron Rad. (1999). 6, 34-42
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A comparative analysis of the K, L3, L2 and L1 edges of Ce in CeO2 has been made and a procedure for obtaining structural parameters from L3-edge EXAFS has been developed.

J. Synchrotron Rad. (1999). 6, 43-49
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At 11.0 GPa the diamond-type structure changes in the high-pressure phase with an increse in coordination numbers, and prolonged bonding distances make the magnitudes of σ(2) larger.

laboratory notes

J. Synchrotron Rad. (1999). 6, 50
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A fast (∼12 ms) shutter for UHV beamlines is described. In the closed position the beam is blocked by an electrically isolated aluminium piece. The total yield photocurrent in this situation can be used to monitor the beam intensity.

international union of crystallography

J. Synchrotron Rad. (1999). 6, 51-56

J. Synchrotron Rad. (1999). 6, 57
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