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A new method for calculation of crystal susceptibilities for X-ray diffraction at arbitrary wavelength. Erratum
aByelorussian State University, F. Skariny Av. 4, 220050 Minsk, Republic of Belarus, and bBruker AXS, Östl. Rheinbrückenstrasse 50, 76187 Karlsruhe, Germany
*Correspondence e-mail: alex.ulyanenkov@bruker-axs.de
In the paper by Feranchuk, Gurskii, Komarov, Lugovskaya, Burgäzy & Ulyanenkov [Acta Cryst. (2002)![[Feranchuk, I. D., Gurskii, L. I., Komarov, L. I., Lugovskaya, O. M., Burgäzy, F. & Ulyanenkov, A. (2002). Acta Cryst. A58, 370-384.]](../../../../../../logos/arrows/a_arr.gif "Feranchuk, I. D., Gurskii, L. I., Komarov, L. I., Lugovskaya, O. M., Burgäzy, F. & Ulyanenkov, A. (2002). Acta Cryst. A58, 370-384.")
. A58, 370–384], there is a misprint in equation (22): instead of parameter s, the normalized parameter s1 = 4πa0s has to be used, where a0 = 0.529177 Å is a The conclusions and other results are correct.
Keywords: susceptibility; atomic scattering factor; Debye–Waller factor.
References
Feranchuk, I. D., Gurskii, L. I., Komarov, L. I., Lugovskaya, O. M., Burgäzy, F. & Ulyanenkov, A. (2002). Acta Cryst. A58, 370–384. Web of Science CrossRef CAS IUCr Journals Google Scholar
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