Determination of depth-dependent diffraction data: a new approach

Broadhurst, A.; Rogers, K.D.; Lowe, T.W.; Lane, D.W.

doi:10.1107/S0108767304026881

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 3
Thin homogeneous film. (a) Generated pseudo-experimental data. (b) Recovered solutions after transformation. Spectra offset for clarity. (c) Calculated and known intensity of peak maximum with depth.

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ISSN: 2053-2733

Volume 61| Part 1| December 2005| Pages 139-146

doi:10.1107/S0108767304026881

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