Ab initio structure determination using dispersive differences from multiple-wavelength synchrotron-radiation powder diffraction data

Helliwell, J.R.; Helliwell, M.; Jones, R.H.

doi:10.1107/S010876730503237X

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 1
Argand diagram showing the contribution of light atoms F_L and the normal scattering of the anomalous-scatterer atoms F_Ho with a stimulated wavelength dispersive effect Δf′. Point B represents an average of the Friedel reflection pairs at λ₂, $[F_{{\rm LH}\lambda_2}^+]$ and $[F_{{\rm LH}\lambda_2}^-]$ , and likewise for point C at λ₁, owing to the superposition of Friedel reflections in powder diffraction data. The angles α_LHλ₂ and α_H are respectively the angles between the real axis and OB for the former and the real axis and AD for the latter. Then, OA = F_L, DC = $[{\bf f} '_{\boldlambda_{\bf 1}}]$ , DB = $[{\bf f} '_{\boldlambda_{\bf 2}}]$ , AD = F_Ho, CB = Δ $[{\bf f} '_{\boldlambda_{\bf 2}-\boldlambda_{\bf 1}}]$ , OB = F_LHλ₂, OC = F_LHλ₁.

FOUNDATIONS
ADVANCES

ISSN: 2053-2733

Volume 61| Part 6| October 2005| Pages 568-574

doi:10.1107/S010876730503237X

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