The MEM/Rietveld method with nano-applications – accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Takata, M.

doi:10.1107/S010876730706521X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 16
(a) The fitting results of Rietveld analysis using the Sc₃@C₈₂ structure model, which has been previously published (Takata, Nishibori, Sakata et al., 1999

). A close up of the region between 19.0 and 41.0° is shown in the inset. (b) The fitting result of the final Rietveld analysis for (Sc₃C₂)@C₈₀. A close up of the region between 19.0 and 41.0° is shown in the inset.

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ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 232-245

https://doi.org/10.1107/S010876730706521X

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