The MEM/Rietveld method with nano-applications – accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Takata, M.

doi:10.1107/S010876730706521X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 17
The molecular structure models of (Sc₃C₂)@C₈₀ along the (a) S₁₀ and (b) C₂ axes determined by the MEM/Rietveld method from synchrotron X-ray powder diffraction data.

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ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 232-245

https://doi.org/10.1107/S010876730706521X

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