The MEM/Rietveld method with nano-applications – accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Takata, M.

doi:10.1107/S010876730706521X

Acta Crystallographica Section A
Acta Crystallographica
Section A FOUNDATIONS AND ADVANCES

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Figure 18
(a) Nano-cage structure of C12A7. MEM charge densities on the (001) plane for (b) C12A7:O²⁻ and (c) C12A7:e⁻ electride. Contour lines are drawn from 0.0 to 6.0 e Å⁻³ with intervals of 0.3 e Å⁻³. Higher-density regions are omitted in the figure.

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ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 232-245

https://doi.org/10.1107/S010876730706521X

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