The MEM/Rietveld method with nano-applications – accurate charge-density studies of nano-structured materials by synchrotron-radiation powder diffraction

Takata, M.

doi:10.1107/S010876730706521X

Acta Crystallographica Section A
Acta Crystallographica
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Figure 7
The procedure of evaluation of observed integrated intensities in MEM/Rietveld analysis. Difference plot (a) for the result of Rietveld refinement and (b) based on the evaluated intensities.

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ISSN: 2053-2733

Volume 64| Part 1| January 2008| Pages 232-245

https://doi.org/10.1107/S010876730706521X

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